Equipment

  • Transmission electron microscope HR JEM 2200 FS (JEOL)

    • Acceleration voltage: 80 - 200 kV
    TEM resolution:
    • guaranteed line resolution: 0,10 nm
    • guaranteed point resolution: 0,19 nm
    STEM resolution:
    • guaranteed point resolution: 0,2 nm
    Energy dispersive X-ray spectroscopy (EDX)
    Electron energy loss spectroscopy (EELS)
    Tomography
  • Transmission electron microscope JEM 1011 (JEOL)

    • Acceleration voltage: 40 - 100 kV
    TEM Resolution:
    • guaranteed line resolution: 0,2 nm
    • guaranteed point resolution: 0,4 nm

  • Cryo scanning electron microscope S-4800 (Hitachi)

    • High resolution:
    • 15 kV: 1 nm
    • 1 kV: 1,4 nm
    EDX system:
    • Thermo - NORAN system SIX (Energy dispersive X-ray microanalysis)
    Cryopreparation system:
    • Gatan – Alto 2500-S
    STEM Imaging
  • Transmission electron microscope EM 902 (Zeiss)

  • Freeze-etching system BAF 400T (BALTEC)

  • Cryo-ultramicrotome (Leica)

  • Field flow fractionation AF 2000 MT (Postnova analytics)

  • Zetasizer 1000 HS (Malvern)

  • Zetasizer Nano –ZS (Malvern)

  • Micro-DSC III (Setaram)

  • MicroDSC 7 evo (Setaram)

  • Rheometer, Bohlin Gemini (Malvern)

  • Polarization microscope (Leica)

  • Tensiometer K 10 ST (Krüss)

  • Viscometry (Lauda)

  • Density DMA 4500 (Anton Paar)

  • ESA field device (PA Meßtechnik)

  • Microprocessor High Performance Conductometer (WTW)

  • Streaming potential measurement PCD 04 (Mütek)

  • Universal ion meter (WTW)

  • UV/VIS/NIR-Spectroscopy (Shimadzu UV-2600 with ISR-2600Plus)
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